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Inline 3D Metrology

Inline 3D Metrology for Precision Manufacturing

Nanometer precision. millidegree alignment. Inline speed. Bridging the gap between off-line quality control and inline automation — so automated tools can align, verify and scale throughput at line-speed.

Nanometer Vertical Resolution
mdeg Angular Alignment
Inline Production Speed
Measure → Align → Correct
ΔX 0.252
ΔY -0.083
ΔZ 0.015
ΔPitch 0.12
ΔYaw -0.08
ΔRoll 0.04
Converging to alignment

Advanced Inline 3D Micro-Metrology

Lab-grade nanometer accuracy. Production-line speed.

Nanometer Vertical Resolution
Sub-Millidegree Alignment
Transparent Material Metrology
Advanced Surface Topography
Reflective Surface Measurement
In-Line Integration
SX3D Platform
SX3D PLATFORM

Nanometer Vertical Resolution

Capture nanometer-scale surface topography, layer thickness and roughness for photonics, semiconductor packaging and precision optics.

SculpX - Inline 3D Metrology

Inline 3D Metrology

Inline 3D Metrology for OEMs, machine builders and system integrators.

SX3D combines advanced 3D perception, Physics-Informed Intelligence and industrial automation to deliver reliable measurement, alignment and positioning results for demanding manufacturing applications.

IMAGING OF TOMORROW

About SculpX Imaging

SculpX Imaging develops inline metrology solutions for OEMs, machine builders and system integrators. By combining advanced 3D perception, Physics-Informed Intelligence and industrial automation, we transform complex image data into reliable measurement, alignment and positioning results for demanding manufacturing applications.

01

Inline 3D Metrology

SX3D combines advanced 3D perception, metrology, alignment intelligence and machine integration into a single industrial platform designed for OEMs, machine builders and system integrators.

02

3D Perception

Capture depth, geometry and surface information from complex industrial components and assemblies, creating the foundation for reliable measurement, inspection and positioning.

03

Alignment Intelligence

High-precision algorithmic alignment systems engineered to ensure sub-micron accuracy across high-speed automated production pipelines.

04

Machine Integration

Seamlessly bridge hardware and software interfaces for real-time decision-making, quality control feedback, and closed-loop manufacturing automation.

SX3D Platform Configurations

SX3D PLATFORM CONFIGURATIONS

Built on the same SX3D Vision & Metrology Platform, each configuration is optimized for different field-of-view, resolution and integration requirements.

SX3D High Resolution Metrology Scanner

Nanometer

Vertical Resolution

Fast, high-density micro-metrology for maximum precision micro features.

Primary Strength
Sub-micron lateral detail & nanometer height accuracy.
Field of View
up to 6 × 6 mm²
Lateral Res (X,Y)
down to 0.12 µm
Vertical Res (Z)
down to 0.01 µm (10 nm)
SX3D Large Area Metrology Scanner

Expanded FOV

High Speed Coverage

Fast 3D topography of larger structures and assemblies.

Primary Strength
High-speed coverage of larger structures with nanometer Z-precision.
Field of View
up to 24 × 26 mm²
Lateral Res (X,Y)
down to 4 µm
Vertical Res (Z)
down to 0.01 µm (10 nm)
SX3D-UC Metrology Scanner

Inline Integration

Compact Form Factor

Cost-effective 3D inline measurement & feature alignment.

Primary Strength
Compact form factor for machine integration & inline checks.
Field of View
up to 50 mm²
Lateral Res (X,Y)
down to 6.25 µm
Vertical Res (Z)
down to 2.6 µm

SX3D PLATFORM COMPARISON

FEATURE SX3D-PM HIGH RESOLUTION SX3D-PM LARGE AREA SX3D-UC
Application Focus Micro Features & Maximum Precision Larger Components & Expanded FOVs Cost-Efficient Inline Integration
Primary Strength Sub-micron lateral detail & nanometer height accuracy High-speed coverage of larger structures with nanometer Z-precision Compact form factor for machine integration & inline checks
Measurement Capability Fast, high-density micro-metrology Fast 3D topography of larger structures & assemblies Cost-effective 3D inline measurement & feature alignment
Field of View up to 6 × 6 mm² up to 24 × 26 mm² up to 50 mm²
Lateral Resolution (X,Y) down to 0.12 µm down to 4 µm down to 6.25 µm
Vertical Resolution (Z) down to 0.01 µm (10 nm) down to 0.01 µm (10 nm) down to 2.6 µm
OUR VALUES

What Defines Our Culture

Our work in advanced 3D imaging requires more than innovative technology. It requires a strong cultural foundation. These values guide every measurement we take, every partnership we build, and every challenge we overcome.

01

SYNERGY & PARTNERSHIP

We develop with, not just for our customers.

02

COMMITMENT & OWNERSHIP

Everyone contributes to quality and success.

03

TRANSPARENCY & OPENNESS

Trust grows through visibility and clarity.

04

COURAGE TO DEPTH

We go where others stop.


APPLICATIONS

BEYOND THE KNOWN

Let's Co-Develop the Next Breakthrough

While we have validated our 3D vision solutions across critical application areas, we know the technology has much broader potential.

Are you facing a complex challenge in precision alignment, metrology, assembly, positioning, inspection or process control that existing solutions cannot reliably solve? We are actively seeking partners for pilot programs to apply our technology to the next generation of industrial alignment, measurement, automation and quality assurance applications.

TARGET INDUSTRIES
PHOTONICS
MEDICAL TECHNOLOGY
AUTOMATION
PRECISION ENGINEERING
SEMICONDUCTOR
LIFE SCIENCES
CO-DEVELOPMENT OPPORTUNITY
Let's explore together how advanced 3D vision can unlock new levels of precision, automation and productivity in demanding manufacturing environments.
Interested in exploring a new application? Let's continue the conversation below.
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